Modern electronic assemblies such as populated printed circuit boards (PCBs), ceramic substrates and other miniaturized devices have become significantly more complex over the last few decades. As electronic components continue to shrink, conductor spacing and terminal pitches have decreased dramatically. While older electronic assemblies featured relatively large conductor distances, modern SMT technologies brought IO pitches to 1,27mm, but they soon shrank to 1mm and 0,5mm. At the same time, the insulation distances between matrix-array terminals decreased to about 100 micrometers. Additionally, new assemblies, such as interposers for active components and wafer-level packages, represent new categories that came into consideration only several years ago.
This extreme miniaturization creates new challenges regarding electrical insulation resistance, contamination sensitivity, and long-term reliability. Even small amounts of ionic residues or moisture can negatively affect performance and increase the risk of failures.
